Active control of dielectrophoretic force at nanowire electrode for ultrahigh single nanoparticle manipulation yield
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作者:
Kim, Jinsik
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Korea Inst Sci & Technol, Ctr Bion, Seoul, South Korea
Korea Univ, Sch Elect Engn, Seoul, South KoreaKorea Inst Sci & Technol, Ctr Bion, Seoul, South Korea
Kim, Jinsik
[1
,2
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Lee, Sangyoup
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Korea Inst Sci & Technol, Ctr Theragnosis, Seoul, South KoreaKorea Inst Sci & Technol, Ctr Bion, Seoul, South Korea
Lee, Sangyoup
[3
]
Suh, Jun-Kyo Francis
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Korea Inst Sci & Technol, Ctr Bion, Seoul, South KoreaKorea Inst Sci & Technol, Ctr Bion, Seoul, South Korea
Suh, Jun-Kyo Francis
[1
]
Park, Jung Ho
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Korea Univ, Sch Elect Engn, Seoul, South KoreaKorea Inst Sci & Technol, Ctr Bion, Seoul, South Korea
Park, Jung Ho
[2
]
Shin, Hyun-Joon
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Korea Inst Sci & Technol, Ctr Bion, Seoul, South KoreaKorea Inst Sci & Technol, Ctr Bion, Seoul, South Korea
Shin, Hyun-Joon
[1
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机构:
[1] Korea Inst Sci & Technol, Ctr Bion, Seoul, South Korea
[2] Korea Univ, Sch Elect Engn, Seoul, South Korea
[3] Korea Inst Sci & Technol, Ctr Theragnosis, Seoul, South Korea
We introduce ultrahigh-yield single nanoparticle control based on active control of the dielectrophoretic (DEP) force (ACDF). Attachment and detachment are accomplished reversibly using a combination of negative and positive DEP forces. A silicon-oxide (SiO2)-surrounded gold nanowire electrode was designed for ACDF. Nanoparticle motions were analyzed to confirm inducement of the negative DEP force, which is the most important for realizing ACDF. Polystyrene nanobeads and quantum dots were used. Ultrahigh-yield single nanoparticle manipulation was achieved at every designed position using ACDF. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4791599]