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- [1] Thermal Performance Improvement of GaN-on-Diamond High Electron Mobility Transistors[J]. 2018 76TH DEVICE RESEARCH CONFERENCE (DRC), 2018,Tadjer, Marko J.论文数: 0 引用数: 0 h-index: 0机构: US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USA US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USAAnderson, Travis J.论文数: 0 引用数: 0 h-index: 0机构: US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USA US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USAGallagher, James C.论文数: 0 引用数: 0 h-index: 0机构: 1818 N St NW, Washington, DC 20036 USA US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USARaad, Peter E.论文数: 0 引用数: 0 h-index: 0机构: TMX Sci, Richardson, TX USA Southern Methodist Univ, Dallas, TX 75275 USA US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USAKomarov, Pavel论文数: 0 引用数: 0 h-index: 0机构: TMX Sci, Richardson, TX USA Southern Methodist Univ, Dallas, TX 75275 USA US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USAKoehler, Andrew D.论文数: 0 引用数: 0 h-index: 0机构: US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USA US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USAHobart, Karl D.论文数: 0 引用数: 0 h-index: 0机构: US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USA US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USAKub, Fritz J.论文数: 0 引用数: 0 h-index: 0机构: US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USA US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USA
- [2] The effect of GaN epilayer thickness on the near-junction thermal resistance of GaN-on-diamond devices[J]. INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER, 2020, 158Song, Changhwan论文数: 0 引用数: 0 h-index: 0机构: Kyung Hee Univ, Dept Mech Engn, 1732 Deogyeong Daero, Yongin 17104, Gyeonggi Do, South Korea Sungkyunkwan Univ, Sch Mech Engn, 2066 Seobu Ro, Suwon 16419, Gyeonggi Do, South Korea Kyung Hee Univ, Dept Mech Engn, 1732 Deogyeong Daero, Yongin 17104, Gyeonggi Do, South KoreaKim, Jihyun论文数: 0 引用数: 0 h-index: 0机构: Kyung Hee Univ, Dept Mech Engn, 1732 Deogyeong Daero, Yongin 17104, Gyeonggi Do, South Korea Sungkyunkwan Univ, Sch Mech Engn, 2066 Seobu Ro, Suwon 16419, Gyeonggi Do, South Korea Kyung Hee Univ, Dept Mech Engn, 1732 Deogyeong Daero, Yongin 17104, Gyeonggi Do, South KoreaCho, Jungwan论文数: 0 引用数: 0 h-index: 0机构: Kyung Hee Univ, Dept Mech Engn, 1732 Deogyeong Daero, Yongin 17104, Gyeonggi Do, South Korea Sungkyunkwan Univ, Sch Mech Engn, 2066 Seobu Ro, Suwon 16419, Gyeonggi Do, South Korea Kyung Hee Univ, Dept Mech Engn, 1732 Deogyeong Daero, Yongin 17104, Gyeonggi Do, South Korea
- [3] FEM thermal analysis of high power GaN-on-diamond HEMTs[J]. Journal of Semiconductors, 2018, (10) : 50 - 56论文数: 引用数: h-index:机构:Wenbo Zhai论文数: 0 引用数: 0 h-index: 0机构: Key Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University Wide Band Gap Semiconductor Research Center,Xi'an Jiaotong University Key Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University论文数: 引用数: h-index:机构:Renan Bu论文数: 0 引用数: 0 h-index: 0机构: Wide Band Gap Semiconductor Research Center,Xi'an Jiaotong University Key Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:
- [4] FEM thermal analysis of high power GaN-on-diamond HEMTs[J]. Journal of Semiconductors., 2018, 39 (10) - 56论文数: 引用数: h-index:机构:Wenbo Zhai论文数: 0 引用数: 0 h-index: 0机构: Key Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University Wide Band Gap Semiconductor Research Center,Xi'an Jiaotong University Key Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University论文数: 引用数: h-index:机构:Renan Bu论文数: 0 引用数: 0 h-index: 0机构: Wide Band Gap Semiconductor Research Center,Xi'an Jiaotong University Key Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:
- [5] FEM thermal analysis of high power GaN-on-diamond HEMTs[J]. JOURNAL OF SEMICONDUCTORS, 2018, 39 (10)Chen, Xudong论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Key Lab Photon Technol Informat Shaanxi Prov, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Wide Band Gap Semicond Res Ctr, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R ChinaZhai, Wenbo论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Key Lab Photon Technol Informat Shaanxi Prov, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Wide Band Gap Semicond Res Ctr, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R ChinaZhang, Jingwen论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Key Lab Photon Technol Informat Shaanxi Prov, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Wide Band Gap Semicond Res Ctr, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, ISCAS XJTU Joint Lab Funct Mat & Devices Informat, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R ChinaBu, Renan论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Wide Band Gap Semicond Res Ctr, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R ChinaWang, Hongxing论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Wide Band Gap Semicond Res Ctr, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R ChinaHou, Xun论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Wide Band Gap Semicond Res Ctr, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R China
- [6] Effect of GaN-on-diamond integration technology on its thermal properties[J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2021, 36 (10)Li, Yao论文数: 0 引用数: 0 h-index: 0机构: Xian Univ Technol, Dept Elect Engn, CO-710048 Xian, Peoples R China Xidian Univ, Key Lab Wide Band Gap Semicond Mat, Minist Educ, CO-710071 Xian, Peoples R China Xian Univ Technol, Dept Elect Engn, CO-710048 Xian, Peoples R ChinaZheng, Zixuan论文数: 0 引用数: 0 h-index: 0机构: Xian Univ Technol, Dept Elect Engn, CO-710048 Xian, Peoples R China Xian Univ Technol, Dept Elect Engn, CO-710048 Xian, Peoples R ChinaZhang, Chao论文数: 0 引用数: 0 h-index: 0机构: Xian Univ Technol, Dept Elect Engn, CO-710048 Xian, Peoples R China Xian Univ Technol, Dept Elect Engn, CO-710048 Xian, Peoples R ChinaPu, Hongbin论文数: 0 引用数: 0 h-index: 0机构: Xian Univ Technol, Dept Elect Engn, CO-710048 Xian, Peoples R China Xian Univ Technol, Dept Elect Engn, CO-710048 Xian, Peoples R China
- [7] The Effect of Interlayer Microstructure on the Thermal Boundary Resistance of GaN-on-Diamond Substrate[J]. COATINGS, 2022, 12 (05)Jia, Xin论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Metrol, Ctr Adv Measurement Sci, Beijing 100029, Peoples R China Natl Inst Metrol, Ctr Adv Measurement Sci, Beijing 100029, Peoples R ChinaHuang, Lu论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Metrol, Ctr Adv Measurement Sci, Beijing 100029, Peoples R China Natl Inst Metrol, Ctr Adv Measurement Sci, Beijing 100029, Peoples R ChinaSun, Miao论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Metrol, Ctr Adv Measurement Sci, Beijing 100029, Peoples R China Natl Inst Metrol, Ctr Adv Measurement Sci, Beijing 100029, Peoples R ChinaZhao, Xia论文数: 0 引用数: 0 h-index: 0机构: Beijing Inst Metrol, Res Lab Thermal Flow & Proc Control, Beijing 100029, Peoples R China Natl Inst Metrol, Ctr Adv Measurement Sci, Beijing 100029, Peoples R China论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:
- [8] A novel strategy for GaN-on-diamond device with a high thermal boundary conductance[J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2022, 905Mu, Fengwen论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R ChinaXu, Bin论文数: 0 引用数: 0 h-index: 0机构: Univ Tokyo, Dept Mech Engn, Bunkyo Ku, Tokyo 1138656, Japan Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R ChinaWang, Xinhua论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R China Univ Chinese Acad Sci, Beijing 100049, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R China Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R ChinaGao, Runhua论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R ChinaHuang, Sen论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R China Univ Chinese Acad Sci, Beijing 100049, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R China Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R ChinaWei, Ke论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R ChinaTakeuchi, Kai论文数: 0 引用数: 0 h-index: 0机构: Meisei Univ, Collaborat Res Ctr, Hino, Tokyo 1918506, Japan Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R ChinaChen, Xiaojuan论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R ChinaYin, Haibo论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R ChinaWang, Dahai论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R ChinaYu, Jiahan论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Integrated Circuit Adv Proc R&D Ctr, Beijing 100029, Peoples R China Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R ChinaSuga, Tadatomo论文数: 0 引用数: 0 h-index: 0机构: Meisei Univ, Collaborat Res Ctr, Hino, Tokyo 1918506, Japan Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R ChinaShiomi, Junichiro论文数: 0 引用数: 0 h-index: 0机构: Univ Tokyo, Dept Mech Engn, Bunkyo Ku, Tokyo 1138656, Japan Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R ChinaLiu, Xinyu论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R China Univ Chinese Acad Sci, Beijing 100049, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R China Chinese Acad Sci, High Frequency High Voltage Device & Integrated C, Inst Microelect, Beijing 100029, Peoples R China
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- [10] A novel strategy for GaN-on-diamond device with a high thermal boundary conductance[J]. Journal of Alloys and Compounds, 2022, 905Mu, Fengwen论文数: 0 引用数: 0 h-index: 0机构: High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, China High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, ChinaXu, Bin论文数: 0 引用数: 0 h-index: 0机构: Department of Mechanical Engineering, The University of Tokyo, Bunkyo, Tokyo,113–8656, Japan High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, ChinaWang, Xinhua论文数: 0 引用数: 0 h-index: 0机构: High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, China University of Chinese Academy of Sciences, Beijing,100049, China Key Laboratory of Microelectronic Devices & Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, China High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, ChinaGao, Runhua论文数: 0 引用数: 0 h-index: 0机构: High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, China High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, ChinaHuang, Sen论文数: 0 引用数: 0 h-index: 0机构: High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, China University of Chinese Academy of Sciences, Beijing,100049, China Key Laboratory of Microelectronic Devices & Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, China High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, ChinaWei, Ke论文数: 0 引用数: 0 h-index: 0机构: High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, China High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, ChinaTakeuchi, Kai论文数: 0 引用数: 0 h-index: 0机构: Collaborative Research Center, Meisei University, Hino-shi, Tokyo,191–8506, Japan High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, ChinaChen, Xiaojuan论文数: 0 引用数: 0 h-index: 0机构: High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, China High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, China论文数: 引用数: h-index:机构:Wang, Dahai论文数: 0 引用数: 0 h-index: 0机构: High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, China High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, ChinaYu, Jiahan论文数: 0 引用数: 0 h-index: 0机构: Integrated Circuit Advanced Process R&D Center, Institute of Microelectronics of Chinese Academy of Sciences, Beijing,100029, China High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, China论文数: 引用数: h-index:机构:Shiomi, Junichiro论文数: 0 引用数: 0 h-index: 0机构: Department of Mechanical Engineering, The University of Tokyo, Bunkyo, Tokyo,113–8656, Japan High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing,100029, China论文数: 引用数: h-index:机构: