Analysis of tolerances in a grating interferometer for high-resolution displacement measurement

被引:2
|
作者
Dobosz, M [1 ]
机构
[1] Inst Metrol & Measuring Syst, PL-02525 Warsaw, Poland
关键词
displacement measurement; interferometer; laser diode; diffraction grating; focused light;
D O I
10.1117/12.357720
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A grating interferometer for high-resolution displacement measurements is analyzed. To decrease interferometer sensitivity to inaccuracy of the grating guide, a laser diode beam is focused on the grating surface. The effect of the interferometer geometry on the direction and period of the fringes is analyzed. In addition, the influence of the system geometry on the optical path difference is evaluated. Methods of adjustment of the fringe direction and period and also the zero value of the optical path difference in the interferometer are proposed. The theoretical analysis is verified experimentally by analyzing separately the influence of selected geometrical parameters on fringe direction and fringe constant. The experimental results are compared with regression models obtained by theoretical analysis. More than 92% results variability is caused by the theoretically predicted model of functions.
引用
收藏
页码:253 / 261
页数:9
相关论文
共 50 条
  • [41] Displacement measurement error of grating interferometer based on vector diffraction theory
    Lei L.
    Zhang Y.
    Fu Y.
    [J]. Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering, 2024, 53 (02):
  • [42] Displacement measurement using a wavelength-phase-shifting grating interferometer
    Lee, Ju-Yi
    Jiang, Geng-An
    [J]. OPTICS EXPRESS, 2013, 21 (21): : 25553 - 25564
  • [43] In-plane displacement measurement by using circular grating Talbot interferometer
    Agarwal, Shilpi
    Shakher, Chandra
    [J]. OPTICS AND LASERS IN ENGINEERING, 2015, 75 : 63 - 71
  • [44] High-resolution displacement measurement using mode interference in the optical waveguide
    Doi, M
    Iwasaki, Y
    Shionoya, T
    Okamoto, K
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 1997, 9 (05) : 651 - 653
  • [45] THE X-RAY-INTERFEROMETER FOR HIGH-RESOLUTION MEASUREMENT OF ANOMALOUS DISPERSION AT HASYLAB
    BONSE, U
    HARTMANNLOTSCH, I
    LOTSCH, H
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 208 (1-3): : 603 - 604
  • [46] High-resolution temperature measurement using phase-compensating interferometer and frequency-monitoring interferometer
    Murakami, Fumio
    Nakano, Taketoshi
    Ohta, Tatehisa
    Ichinose, Takumi
    [J]. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1994, 33 (3 B): : 1708 - 1712
  • [47] A HIGH-RESOLUTION GRATING FLAME SPECTROMETER
    TABELING, RW
    BREHM, RK
    [J]. SPECTROCHIMICA ACTA, 1956, 8 (03): : 198 - 198
  • [48] A HIGH-RESOLUTION GRATING FLAME SPECTROMETER
    TABELING, RW
    [J]. ANALYTICAL CHEMISTRY, 1956, 28 (11) : 1798 - 1798
  • [49] PREDISPERSER FOR HIGH-RESOLUTION GRATING SPECTROGRAPHS
    READER, J
    MARQUET, LC
    DAVIS, SP
    [J]. APPLIED OPTICS, 1963, 2 (09): : 963 - 967
  • [50] INRARED HIGH-RESOLUTION GRATING SPECTROMETER
    PLYLER, EK
    BLAINE, LR
    [J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1959, 62 (01): : 7 - 9