Measurement of surface defects on thin steel wires by atomic force microscopy

被引：12
|
作者：
Sánchez-Brea, LM [1 ]
Gómez-Pedrero, JA [1 ]
Bernabeu, E [1 ]
机构：
[1] Univ Complutense Madrid, Fac Ciencias Fis, Dept Opt, E-28040 Madrid, Spain
来源：
APPLIED SURFACE SCIENCE | 1999年 / 150卷 / 1-4期
关键词：
surface defects in metallic wires;
D O I：
10.1016/S0169-4332(99)00234-2
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The characterisation of surface defects on thin metallic wipes is very important for the industrial applications of these wires. The physical dimensions of the surface defects presented by several thin steel wires of different diameters have been measured using Atomic Force Microscopy (AFM). The measurements made show two main defects in thin steel wires: holes and scratches, but other defects like porosity or protuberances have also been observed. We have found an empirical relationship between the physical dimensions of the scratches and the wire diameter. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：125 / 130
页数：6
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