Ellipsometric study of anodic oxide films on alloys of the Ti-Al system

被引：1
|
作者：
Kamkin, AN [1 ]
Fishgoit, LA [1 ]
Bukhan'ko, NG [1 ]
Portnov, VI [1 ]
Safonov, VA [1 ]
机构：
[1] Moscow MV Lomonosov State Univ, Moscow 119899, Russia
来源：
RUSSIAN JOURNAL OF ELECTROCHEMISTRY | 2001年 / 37卷 / 11期
基金：
俄罗斯基础研究基金会;
关键词：
D O I：
10.1023/A:1012755329986
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
Anodic oxide films (AOF) on neat titanium and on alloys of the Ti-Al system (Ti-10 at. % Al, Ti-24 at. % Al, Ti-50 at. % Al, Ti-75 at. % Al) formed in borate buffer solution are studied by ellipsometry. A model is proposed, which adequately describes the shape of the alloy surface with and without AOF The model takes into account the roughness factor, allowing one to more correctly determine optical parameters of AOF and dependence of its thickness on anodic potential. It is found that the alloy surface roughness is effectively smoothed with increasing applied potential.
引用
收藏
页码：1140 / 1148
页数：9
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