Formal-Analysis-Based Trace Computation for Post-Silicon Debug

被引:6
|
作者
Gort, Marcel [1 ]
De Paula, Flavio M. [3 ]
Kuan, Johnny J. W. [2 ]
Aamodt, Tor M. [2 ]
Hu, Alan J. [3 ]
Wilton, Steven J. E. [2 ]
Yang, Jin [4 ]
机构
[1] Univ Toronto, Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada
[2] Univ British Columbia, Dept Elect & Comp Engn, Vancouver, BC V6T 1Z4, Canada
[3] Univ British Columbia, Dept Comp Sci, Vancouver, BC V6T 1Z4, Canada
[4] Intel Corp, Strateg CAD Labs, Hillsboro, OR 97124 USA
关键词
Formal analysis; hardware breakpoint; post-silicon debug; silicon debug; validation; VISIBILITY ENHANCEMENT; SIGNAL SELECTION; DESIGN;
D O I
10.1109/TVLSI.2011.2166416
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper presents a post-silicon debug methodology that provides a means to rewind, or backspace, a chip from a known crash state using a combination of on-chip real-time data collection and off-chip formal analysis methods. A complete debug flow is presented that considers practical considerations such as area, on-chip non-determinism and signal propagation delay. This flow, along with a low-overhead breakpoint circuit, allows for state-accurate breakpointing capabilities without the need to monitor the entire state of the chip. The flow and associated hardware was tested using a hardware prototype, which consists of an OpenRISC processor instrumented with the debug hardware connected to a PC running the formal verification algorithms. Traces hundreds of cycles long were obtained using the methodology presented in this paper.
引用
收藏
页码:1997 / 2010
页数:14
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