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- [3] A Formal Perspective on Effective Post-silicon Debug and Trace Signal Selection VLSI DESIGN AND TEST, 2017, 711 : 753 - 766
- [4] Dynamic Selection of Trace Signals for Post-Silicon Debug 2013 14TH INTERNATIONAL WORKSHOP ON MICROPROCESSOR TEST AND VERIFICATION (MTV): COMMON CHALLENGES AND SOLUTIONS, 2013, : 62 - 67
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- [6] A Trace Signal Selection Algorithm for Improved Post-Silicon Debug PROCEEDINGS OF 2016 IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS), 2016,
- [10] Flip-flop Clustering based Trace Signal Selection for Post-Silicon Debug 2017 IEEE 35TH VLSI TEST SYMPOSIUM (VTS), 2017,