GaN HEMTs Power Module Package Design and Performance Evaluation

被引:0
|
作者
Ho, Chung-Hsiang [1 ]
Chou, Po-Chien [1 ]
Cheng, Stone [1 ]
机构
[1] Natl Chiao Tung Univ, Dept Mech Engn, Hsinchu, Taiwan
关键词
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper described the electronic performance of power module packaged high-power AlGaN/GaN high electron mobility transistors (HEMTs) on silicon substrate. Twelve GaN HEMTs chips are mounted on AlN substrate. Each device is wire-bonded in parallel connection to increase the power rating. Both DC and pulsed current-voltage (ID-VDS) characteristics are measured with different connection and sizes of devices, at various power densities, pulse lengths, and duty factors. The packaged GaN HEMTs exhibit the pulsed drain current, 0.43 A/mm. The performance of packaged multichip GaN HEMTs power module is studied. The GaN HEMTs power module exhibit a drain current of 23.04 A, which indicates that connecting GaN HEMTs devices in parallel can effectively increase the drain current.
引用
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页码:96 / 98
页数:3
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