Particle encapsulation techniques for atom probe tomography of precipitates in microalloyed steels

被引:4
|
作者
Webel, Johannes [1 ,2 ]
Weber, Louis [3 ]
Vardo, Emina [4 ]
Britz, Dominik [1 ,2 ]
Kraus, Tobias [5 ]
Muecklich, Frank [1 ,2 ]
机构
[1] Univ Saarland, Inst Funct Mat, Campus D3 3, D-66123 Saarbrucken, Germany
[2] MECS Mat Engn Ctr Saarland, Campus D3 3, D-66123 Saarbrucken, Germany
[3] INM Leibniz Inst New Mat, Campus D2 2, D-66123 Saarbrucken, Germany
[4] Univ Zenica, Fac Met & Technol, Travnicka Cesta 1, Zenica 72000, Bosnia & Herceg
[5] Saarland Univ, Colloid & Interface Chem, Campus D2 2, D-66123 Saarbrucken, Germany
关键词
Atom probe tomography; Particle encapsulation; Increased particle detection probability; Nb-Ti-microalloyed HSLA steel;
D O I
10.1016/j.ultramic.2021.113219
中图分类号
TH742 [显微镜];
学科分类号
摘要
Atom probe tomography (APT) provides sub-nm resolution in the analysis of complex industrial steels. It can resolve the carbonitride precipitates in Nb-Ti microalloyed high-strength low-alloy (HSLA) steels that strongly affect material performance and illuminate the complex precipitation sequence before and during the thermo-mechanical controlled process (TMCP). However, the precipitate concentration is low in HSLA steels during austenite conditioning, especially at temperatures > 850 degrees C, so that the probability of detecting precipitates via APT is below 5%. Here, we demonstrate two encapsulation-based approaches that increase the precipitate concentration in the APT sample volume sufficiently to enable the analysis of sparse precipitates. The first method is based on metallographic etching and direct targeting of precipitates in the steel. A focused ion beam was used to mark precipitation sites. Encapsulation with nickel-phosphorus (Ni-P) enabled localized APT and increased the yield by a factor of 10. The second method relies on the chemical extraction of precipitates and subsequent encapsulation in a silicon oxide (SiOx) network at a very high particle density. Analysis of tips cut from the encapsulated particles increased the yield by a factor of >15. We discuss and compare the spatial and chemical accuracy obtained in the analysis of pure Nb-, Ti- and mixed Nb-Ti carbonitrides.
引用
收藏
页数:8
相关论文
共 50 条
  • [31] Atom probe tomography
    Miller, M. K.
    Forbes, R. G.
    MATERIALS CHARACTERIZATION, 2009, 60 (06) : 461 - 469
  • [32] Atom probe tomography
    Gault, Baptiste
    Chiaramonti, Ann
    Cojocaru-Miredin, Oana
    Stender, Patrick
    Dubosq, Renelle
    Freysoldt, Christoph
    Makineni, Surendra Kumar
    Li, Tong
    Moody, Michael
    Cairney, Julie M.
    NATURE REVIEWS METHODS PRIMERS, 2021, 1 (01):
  • [33] Atom probe tomography
    Nature Reviews Methods Primers, 1
  • [34] Atom Probe Tomography
    Felfer, P.
    Stephenson, L. T.
    Li, T.
    PRAKTISCHE METALLOGRAPHIE-PRACTICAL METALLOGRAPHY, 2018, 55 (08): : 515 - 526
  • [35] Atom Probe Tomography
    Shea, John J.
    IEEE ELECTRICAL INSULATION MAGAZINE, 2017, 33 (04) : 71 - 71
  • [36] Atom Probe Tomography of Carbides in Fe-Cr-(W)-C Steels
    Gramlich, Alexander R. M.
    Auger, Maria A.
    Schneider, Andre
    Moody, Michael P.
    STEEL RESEARCH INTERNATIONAL, 2019, 90 (08)
  • [37] Atom probe tomography of reactor pressure vessel steels: An analysis of data integrity
    Hyde, J. M.
    Burke, M. G.
    Gault, B.
    Saxey, D. Wf.
    Styman, P.
    Wilford, K. B.
    Williams, T. J.
    ULTRAMICROSCOPY, 2011, 111 (06) : 676 - 682
  • [38] Atom probe tomography of carbides occurring in "carbide-free" bainitic steels
    Hofer, C.
    Winkelhofer, F.
    Krammerbauer, J.
    Clemens, H.
    Primig, S.
    MATERIALS TODAY-PROCEEDINGS, 2015, 2 : 925 - 928
  • [39] Influence of incomplete dissolution of precipitates on static recrystallisation of vanadium microalloyed steels
    Revidriego, FJ
    Abad, R
    Lopez, B
    Gutierrez, I
    Urcola, JJ
    SCRIPTA MATERIALIA, 1996, 34 (10) : 1589 - 1594
  • [40] Graphene encapsulation enabled high-throughput atom probe tomography of liquid specimens
    Qiu, Shi
    Garg, Vivek
    Zhang, Shuo
    Chen, Yu
    Li, Jian
    Taylor, Adam
    Marceau, Ross K. W.
    Fu, Jing
    ULTRAMICROSCOPY, 2020, 216