Electrical properties of surface-barrier diodes based on CdZnTe

被引:10
|
作者
Kosyachenko, LA [1 ]
Rarenko, IM [1 ]
Zakharchuk, ZI [1 ]
Sklyarchuk, VM [1 ]
Sklyarchuk, EF [1 ]
Solonchuk, IV [1 ]
Kabanova, IS [1 ]
Maslyanchuk, EL [1 ]
机构
[1] Chernovtsy Natl Univ, UA-58012 Chernovtsy, Ukraine
关键词
D O I
10.1134/1.1548671
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Diode structures obtained by vacuum sputtering deposition of Al onto the surface of p-Cd1-xZnxTe (x=0.05) single crystals were studied. In the context of the Sah-Noyce-Shockley model for generation and recombination of charge carriers, a quantitative description of the diodes' electrical characteristics is attained. (C) 2003 MAIK "Nauka/Interperiodica".
引用
收藏
页码:227 / 232
页数:6
相关论文
共 50 条
  • [41] EXPERIMENTS ON SURFACE-BARRIER DETECTORS
    JOHANSSON, N
    WICKENBERG, G
    ARKIV FOR FYSIK, 1962, 22 (05): : 414 - 414
  • [42] SURFACE-BARRIER CONFINEMENT OF PLASMAS
    JONES, R
    LETTERE AL NUOVO CIMENTO, 1985, 42 (06): : 305 - 308
  • [43] SILICON SURFACE-BARRIER TRANSISTORS
    BRADLEY, WE
    PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1954, 42 (02): : 486 - 486
  • [44] SURFACE-BARRIER FOR TRITIUM PERMEATION
    TANABE, T
    FUSION TECHNOLOGY, 1995, 28 (03): : 1278 - 1283
  • [45] SURFACE-BARRIER FOR ELECTRONS IN METALS
    JENNINGS, PJ
    JONES, RO
    WEINERT, M
    PHYSICAL REVIEW B, 1988, 37 (11): : 6113 - 6120
  • [46] SURFACE-BARRIER EFFECTS IN LEPD
    JENNINGS, PJ
    NEILSON, D
    SOLID STATE COMMUNICATIONS, 1988, 65 (07) : 649 - 652
  • [47] CHEMISORPTION AND SURFACE-BARRIER STRUCTURE
    JENNINGS, PJ
    JONES, RO
    SURFACE SCIENCE, 1986, 176 (03) : 691 - 700
  • [48] SILICON SURFACE-BARRIER PHOTOCELLS
    AHLSTROM, E
    GARTNER, WW
    JOURNAL OF APPLIED PHYSICS, 1962, 33 (08) : 2602 - +
  • [49] SURFACE-BARRIER BEAM MONITOR
    LAKIN, WL
    NUCLEAR INSTRUMENTS & METHODS, 1972, 102 (02): : 367 - &
  • [50] PROPERTIES OF SURFACE-BARRIER M-N-INP STRUCTURES
    KOROTCHENKOV, GS
    MOLODYAN, IP
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1978, 12 (02): : 141 - 143