On-wafer vector network analyzer measurements in the 220-325 GHz frequency band

被引：25

作者：

Fung, A. K. ^{[1
]}

Dawson, D. ^{[1
]}

Samoska, L. ^{[1
]}

Lee, K. ^{[1
]}

Oleson, C. ^{[2
]}

Boll, G. ^{[3
]}

机构：

[1] CALTECH, Jet Prop Lab, 4800 Oak Grove Dr, Pasadena, CA 91109 USA

[2] Oleson Microwave Labs, Morgan Hill, CA 95037 USA

[3] GGB Ind, Naples, FL 34101 USA

来源：

2006 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-5 | 2006年

关键词：

MMIC amplifiers; coplanar transmission lines; coplanar waveguides; measurement;

D O I：

10.1109/MWSYM.2006.249811

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We report on a full two-port on-wafer vector network analyzer test set for the 220-325 GHz (WR3) frequency band. The test set utilizes Oleson Microwave Labs frequency extenders with the Agilent 8510C network analyzer. Two port on-wafer measurements are made with GGB Industries coplanar waveguide (CPW) probes. With this test set we have measured the WR3 band S-parameters of amplifiers on-wafer, and the characteristics of the CPW wafer probes. Results for a three stage InP HEMT amplifier show 10 dB gain at 235 GHz [1], and that of a single stage amplifier, 2.9 dB gain at 231 GHz The approximate upper limit of loss per CPW probe range from 3.0 to 4.8 dB across the WR3 frequency band.

引用

页码：1931 / +

页数：2

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