Mapping the elemental distribution in sol-gel derived ceramics

被引：4
|
作者：
Houk, CS [1 ]
Page, CJ [1 ]
机构：
[1] UNIV OREGON,DEPT CHEM,EUGENE,OR 97403
来源：
ADVANCED MATERIALS | 1996年 / 8卷 / 02期
关键词：
D O I：
10.1002/adma.19960080218
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Elemental dispersive X-ray (EDX) composition distribution mapping using a scanning electronmicroscope (SEM) provides information about samples that is complementary to that obtained from X-ray diffraction. Examples are given (e.g., Ba and Cu maps of YBa2CU3O7-delta see figure) to demonstrate the usefulness of this technique in evaluating the homogeneity of sol-gel products and in elucidating elemental zoning (see also cover picture).
引用
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页码：173 / &
页数：5
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