Low-energy electron diffraction patterns using field-emitted electrons from tungsten tips

被引:18
|
作者
Mizuno, S [1 ]
Rahman, F [1 ]
Iwanaga, M [1 ]
机构
[1] Kyushu Univ, Dept Mol & Mat Sci, Kasuga, Fukuoka 8168580, Japan
关键词
low-energy electron diffraction (LEED); field emission; scanning tunneling microscopy (STM);
D O I
10.1143/JJAP.45.L178
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have observed low-energy electron diffraction patterns of Cu(001) clean surface using field-emitted electrons from tungsten tips. Only elastically scattered electrons contribute to diffraction patterns. Tip-sample distance, bias voltage, electron beam opening angle and tip apex structure determine the probing diameter and symmetry of diffraction patterns. The emission current, bias voltage and estimated probing diameter for the observed diffraction patterns were 0.15 nA, 75-82 V, and 440 mu m, respectively.
引用
收藏
页码:L178 / L179
页数:2
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