Low-energy electron diffraction patterns using field-emitted electrons from tungsten tips

被引：18

作者：

Mizuno, S ^{[1
]}

Rahman, F ^{[1
]}

Iwanaga, M ^{[1
]}

机构：

[1] Kyushu Univ, Dept Mol & Mat Sci, Kasuga, Fukuoka 8168580, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2006年 / 45卷 / 4-7期

关键词：

low-energy electron diffraction (LEED); field emission; scanning tunneling microscopy (STM);

D O I：

10.1143/JJAP.45.L178

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have observed low-energy electron diffraction patterns of Cu(001) clean surface using field-emitted electrons from tungsten tips. Only elastically scattered electrons contribute to diffraction patterns. Tip-sample distance, bias voltage, electron beam opening angle and tip apex structure determine the probing diameter and symmetry of diffraction patterns. The emission current, bias voltage and estimated probing diameter for the observed diffraction patterns were 0.15 nA, 75-82 V, and 440 mu m, respectively.

引用

页码：L178 / L179

页数：2

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