MxTiSe2 (M=Cr, Mn, Cu) electronic structure study by methods of resonance X-ray photoemission spectroscopy and X-ray absorption spectroscopy

被引：6
|
作者：
Shkvarin, A. S. [1 ,2 ]
Yarmoshenko, Yu. M. [1 ]
Yablonskikh, M. V. [4 ]
Skorikov, N. A. [1 ]
Merentsov, A. I. [1 ,2 ]
Kuznetsov, M. V. [2 ,3 ]
Titov, A. N. [1 ,2 ]
机构：
[1] Russian Acad Sci, Inst Met Phys, Ural Div, Ekaterinburg 620990, Russia
[2] Ural Fed Univ, Ekaterinburg 620083, Russia
[3] Russian Acad Sci, Inst Solid State Chem, Ural Div, Ekaterinburg 620990, Russia
[4] Sincrotrone Trieste SS, I-34149 Basovizza, Ts, Italy
来源：
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS | 2012年 / 73卷 / 12期
关键词：
Photoelectron spectroscopy; Electronic structure; TRANSITION-METAL DICHALCOGENIDES;
D O I：
10.1016/j.jpcs.2012.04.012
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Intercalation of Cu and Mn between the layers of TiSe2 leads to the charge transfer from the doped atom to Ti atoms, electronic states of which form the conduction band of TiSe2. This situation drastically differs from another one being observed during intercalation of other transition metals into TiSe2 that leads to the formation of covalent complexes consisting of intercalated atom and nearest neighborhood of the host lattice. Substitution of Ti by Cr in the host lattice positions does not show both charge transfer nor formation of covalent complexes. (C) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码：1562 / 1565
页数：4
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