Modeling of damage accumulation for Duffing-type systems under severe random excitations

被引:5
|
作者
Yang, B
Mignolet, MP [1 ]
Spottswood, SM
机构
[1] Arizona State Univ, Dept Mech & Aerosp Engn, Tempe, AZ 85287 USA
[2] USAF, Res Lab, Air Vehicles Directorate, Wright Patterson AFB, OH 45433 USA
关键词
fatigue life; aircraft panels; Duffing equations; buckled panels; peaks distribution;
D O I
10.1016/j.probengmech.2003.11.015
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
The focus of this investigation is on the prediction of the fatigue life of aircraft panels subjected to thermal effects and a severe random acoustic excitation. The prototypical equations for this problem, i.e. the single and double well Duffing oscillators subjected to a bandlimited white noise, are first considered. A review of some currently available approaches, i.e. the Rayleigh approximation and the single spectral moment method both with and without Gaussianity correction, strongly suggests that an accurate prediction of the fatigue life for this nonlinear system requires a dedicated model. To this end, an approximation of the probability density function of the peaks of the stationary response of the Duffing oscillators is derived. This model is then used in conjunction with either a narrowband assumption or the single spectral moment methodology to yield a prediction of the fatigue life. The application of this approach to simulation data from both single and double well Duffing oscillators, as well as on the experimental response of an unbuckled panel, demonstrates the reliability of this novel approximation. (C) 2003 Elsevier Ltd. All rights reserved.
引用
收藏
页码:185 / 194
页数:10
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