Microstructure and microwave dielectric properties of Bi12SiO20 ceramics

被引:14
|
作者
Jeong, Byoung-Jik [1 ]
Joung, Mi-Ri [1 ]
Kweon, Sang-Hyo [1 ]
Kim, Jin-Seong [1 ]
Nahm, Sahn [1 ]
Choi, Ji-Won [2 ]
Hwang, Seong-Ju [3 ]
机构
[1] Korea Univ, Dept Mat Sci & Engn, Seoul 136701, South Korea
[2] KIST, Ctr Elect Mat, Seoul 137791, South Korea
[3] Ewha Womans Univ, Dept Chem & Nano Sci, Ctr Intelligent Nanobio Mat, Seoul 120750, South Korea
关键词
Ceramics; Oxides; Dielectric properties; Microstructure; GLASSES; B2O3; SI;
D O I
10.1016/j.materresbull.2012.08.075
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Bi12SiO20 ceramics were well sintered at 800 degrees C after calcination at 700 degrees C. A liquid phase of composition Bi2O3 was formed during the sintering at temperatures >= 800 degrees C and assisted the densification of the Bi12SiO20 ceramics. When the sintering temperature exceeded 800 degrees C, however, the relative density, epsilon(r), and Q x f values of the Bi12SiO20 ceramics decreased, probably due to the formation of a large amount of the liquid phase. The Bi12SiO20 ceramics sintered at 800 degrees C for 5.0 h exhibited excellent microwave dielectric properties with a high epsilon(r) of 43, a high Q x f of 86,802 GHz and a small tau(f) of -10.39 ppm/degrees C. (C) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码:4510 / 4513
页数:4
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