Aspheric formtesting using multiple-wavelength approaches in combination with Sub-Nyquist-techniques

被引：2
|
作者：
Pfeifer, T [1 ]
Mischo, H [1 ]
Evertz, J [1 ]
Tutsch, R [1 ]
机构：
[1] FRAUNHOFER INST PROD TECHNOL,D-52074 AACHEN,GERMANY
来源：
SPECIFICATION, PRODUCTION, AND TESTING OF OPTICAL COMPONENTS AND SYSTEMS | 1996年 / 2775卷
关键词：
aspherics; sub-aperture-interferometry; sub-Nyquist-interferometry; multiple-wavelength-interferometry;
D O I：
10.1117/12.246769
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：401 / 408
页数：8
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