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- [42] IDENTIFICATION OF FIXED AND INTERFACE-TRAP CHARGES IN HOT-CARRIER STRESSED METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS (MOSFETS) THROUGH ULTRAVIOLET-LIGHT ANNEAL AND GATE CAPACITANCE MEASUREMENTS JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1995, 34 (1B): : L101 - L104