Automated measurement system for optoelectronic devices based on National Instruments PXI-platform

被引：0
|
作者：
Cherniak, Maksim E. [1 ]
Pechenkin, Alexander. A. [1 ]
Mozhaev, Roman K. [2 ]
Ulanova, Anastasia V. [2 ]
Nikiforov, Alexander Y. [2 ]
机构：
[1] Specialized Elect Syst SPELS, Moscow, Russia
[2] Natl Res Nucl Univ MEPhI, Moscow Engn Phys Inst, Moscow, Russia
来源：
2017 INTERNATIONAL SIBERIAN CONFERENCE ON CONTROL AND COMMUNICATIONS (SIBCON) PROCEEDINGS | 2017年
关键词：
automation of measurement; PXI-platform; laser diodes; optical power; photodiodes; fiber-optic communication;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The article discusses the automated system for measurement of optical and electrical parameters of optoelectronic devices such as laser diodes and photodiodes using a National Instruments PXI-platform and Ophir laser power sensors. The typical connection circuit and method of parameters control are described.
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页数：4
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