In situ synchrotron X-ray diffraction experiments on electrochemically deposited ZnO nanostructures

被引：13

作者：

Ingham, Bridget ^{[1
,2
]}

Illy, Benoit N. ^{[3
,4
]}

Toney, Michael F. ^{[2
]}

Howdyshell, Marci L. ^{[2
]}

Ryan, Mary P. ^{[3
,4
]}

机构：

[1] Ind Res Ltd, Lower Hutt, New Zealand

[2] Stanford Synchrotron Radiat Lab, Menlo Pk, CA 94025 USA

[3] Univ London Imperial Coll Sci Technol & Med, Dept Mat, London SW7 2AZ, England

[4] Univ London Imperial Coll Sci Technol & Med, London Ctr Nanotechnol, London SW7 2AZ, England

来源：

JOURNAL OF PHYSICAL CHEMISTRY C | 2008年 / 112卷 / 38期

关键词：

D O I：

10.1021/jp806184z

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We present results of in situ synchrotron X-ray diffraction experiments on electrochemically formed ZnO nanostructured films during their growth on to Au substrates. This allows the evolution of texture to be monitored throughout the deposition process. The results are in good agreement with previous in situ X-ray absorption spectroscopy measurements of growth kinetics and indicate that strong preferred orientation, which is not evident from the microstructure, develops early in the growth process.

引用

页码：14863 / 14866

页数：4

共 50 条

[1] X-ray diffraction investigation of electrochemically deposited copper
Pantleon, K
Jensen, JD
Somers, MAJ
EUROPEAN POWDER DIFFRACTION EPDIC 8, 2004, 443-4 : 201 - 204
[2] In situ time resolved X-ray diffraction using synchrotron
Komizo, Y.
Terasaki, H.
SCIENCE AND TECHNOLOGY OF WELDING AND JOINING, 2011, 16 (01) : 79 - 86
[3] In situ studies of epitaxial growth by synchrotron X-ray diffraction
Braun, Wolfgang
Ploog, Klaus H.
SURFACE REVIEW AND LETTERS, 2006, 13 (2-3) : 155 - 166
[4] A synchrotron X-ray diffraction study of in situ biaxial deformation
Collins, D. M.
Mostafavi, M.
Todd, R. I.
Connolley, T.
Wilkinson, A. J.
ACTA MATERIALIA, 2015, 90 : 46 - 58
[5] In situ studies of semiconductor growth by synchrotron X-ray diffraction
Braun, W
Ploog, KH
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, 246 (01): : 50 - 57
[6] In-Situ Analysis of Material Modifications During Deep Rolling by Synchrotron X-Ray Diffraction Experiments
Meyer, Heiner
Epp, Jeremy
RESIDUAL STRESSES 2018, ECRS-10, 2018, 6 : 27 - 32
[7] Synchrotron X-ray diffraction experiments with a prototype hybrid pixel detector
Le Bourlot, C.
Landois, P.
Djaziri, S.
Renault, P. -O.
Le Bourhis, E.
Goudeau, P.
Pinault, M.
Mayne-L'Hermite, M.
Bacroix, B.
Faurie, D.
Castelnau, O.
Launois, P.
Rouziere, S.
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2012, 45 : 38 - 47
[8] SIRIUS: A new beamline for in situ X-ray diffraction and spectroscopy studies of advanced materials and nanostructures at the SOLEIL Synchrotron
Ciatto, G.
Chu, M. H.
Fontaine, P.
Aubert, N.
Renevier, H.
Deschanvres, J. L.
THIN SOLID FILMS, 2016, 617 : 48 - 54
[9] In situ synchrotron X-ray diffraction studies of lithium oxygen batteries
Ryan, Kate R.
Trahey, Lynn
Okasinski, John S.
Burrell, Anthony K.
Ingram, Brian J.
JOURNAL OF MATERIALS CHEMISTRY A, 2013, 1 (23) : 6915 - 6919
[10] IN SITU EXPERIMENTATION WITH BATTERIES USING NEUTRON AND SYNCHROTRON X-RAY DIFFRACTION
Sharma, Neeraj
CERAMICS FOR ENVIRONMENTAL AND ENERGY APPLICATIONS II, 2014, 246 : 167 - 179

← 1 2 3 4 5 →