Sample Preparation Induced Artifacts in Cryo-Electron Tomographs

被引：2
|
作者：
Plevka, Pavel [1 ]
Battisti, Anthony J. [1 ]
Winkler, Dennis C. [2 ]
Tars, Kaspars [3 ]
Holdaway, Heather A. [1 ]
Bator, Carol M. [1 ]
Rossmann, Michael G. [1 ]
机构：
[1] Purdue Univ, Dept Biol Sci, W Lafayette, IN 47907 USA
[2] NIAMSD, Struct Biol Res Lab, NIH, Bethesda, MD 20892 USA
[3] Latvian Biomed Res & Study Ctr, LV-1067 Riga, Latvia
来源：
MICROSCOPY AND MICROANALYSIS | 2012年 / 18卷 / 05期
基金：
美国国家卫生研究院;
关键词：
cryo-EM; microscopy; ice-vacuum interface; artifacts; virus; tomography; VIRUS; RECONSTRUCTIONS;
D O I：
10.1017/S1431927612001298
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We investigated the effects of sample preparation and of the exposure to an electron beam on particles in cryo-electron tomographs. Various virus particles with icosahedral symmetry were examined, allowing a comparison of symmetrically related components that should be identical in structure but might be affected differently by these imaging artifacts. Comparison of tomographic reconstructions with previously determined structures established by an independent method showed that neither freezing nor electron beam exposure produced a significant amount of shrinkage along the z axis (thickness). However, we observed damage to regions of the particles located close to the surface of the vitreous ice.
引用
收藏
页码：1043 / 1048
页数：6
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