Direct synthesis and characterization of single-phase tantalum nitride (Ta2N) nanocrystallites by dc arc discharge

被引：14
|
作者：
Lei, Weiwei [1 ]
Liu, Dan [1 ]
Zhang, Jian [1 ]
Shen, Longhai [1 ]
Li, Xuefei [1 ]
Cui, Qiliang [1 ]
Zou, Guangtian [1 ]
机构：
[1] Jilin Univ, Natl Lab Superhard Mat, Changchun 130012, Peoples R China
来源：
JOURNAL OF ALLOYS AND COMPOUNDS | 2008年 / 459卷 / 1-2期
基金：
中国国家自然科学基金;
关键词：
Ta2N; nitride materials; nanostructures; X-ray diffraction;
D O I：
10.1016/j.jallcom.2007.04.219
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Tantalum nitride (Ta2N) nanocrystallites have been firstly direct synthesized by dc arc discharge and characterized by XRD, TEM, FTIR techniques. The average size of Ta2N nanocrystallites is about 5-10nm. The influence of NH3 concentration of the reaction gas on the as-synthesized Ta2N is studied and it is found that the optimal NH3 concentration of the reaction gas to synthesize single-phase Ta2N was in the range of 10-20%. The growth mechanism of Ta2N was discussed. This synthetic method may be suitable for a direct preparation for mass production of Ta2N nanocrystallites. (c) 2007 Elsevier B.V All rights reserved.
引用
收藏
页码：298 / 301
页数：4
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