Resonant electron tunneling through defects in GaAs tunnel diodes

被引:19
|
作者
Jandieri, K. [1 ,2 ]
Baranovskii, S. D. [1 ,2 ]
Rubel, O. [1 ,2 ]
Stolz, W. [1 ,2 ]
Gebhard, F. [1 ,2 ]
Guter, W. [3 ]
Hermle, M. [3 ]
Bett, A. W. [3 ]
机构
[1] Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
[2] Philipps Univ Marburg, Ctr Mat Sci, D-35032 Marburg, Germany
[3] Fraunhofer Inst Solar Energy Syst, D-79110 Freiburg, Germany
关键词
D O I
10.1063/1.3013886
中图分类号
O59 [应用物理学];
学科分类号
摘要
Current-voltage characteristics of GaAs tunnel diodes are studied experimentally and theoretically. In theoretical calculations contributions of three different transport mechanisms are considered: direct tunneling processes, nonresonant multiphonon tunneling processes via defects, and resonant tunneling processes through defects. The comparison between theoretical results and experimental data reveals resonant tunneling as the dominant transport mechanism at voltages corresponding to the peak current. At higher voltages this mechanism is replaced by nonresonant tunneling, which is in its turn replaced by over-barrier transport at even larger voltages. (C) 2008 American Institute of Physics. [DOI: 10.1063/1.3013886]
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页数:7
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