Frequency dependence in high speed interconnections

被引：2

作者：

Kergonou, G ^{[1
]}

Drissi, M ^{[1
]}

Zak, T ^{[1
]}

Zavier, C ^{[1
]}

机构：

[1] INSA, LCST, CNRS, Rennes, France

来源：

2001 IEEE EMC INTERNATIONAL SYMPOSIUM, VOLS 1 AND 2 | 2001年

关键词：

D O I：

10.1109/ISEMC.2001.950718

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper describes an evaluation of the used transmission line model for high-speed interconnections. The scattering parameters for some microstrip interconnections and their associated discontinuities (straight line, 90 degrees bend and double 45 degrees bend) are compared both to the electrical and electromagnetic simulation and to the measurements. S-parameters permit to approach the structure total losses and various simulations highlight radiation, dielectric and metallic losses. The radiation analysis is also performed, thanks to the Method of Moments, and the obtained results are reported and discussed.

引用

页码：632 / 634

页数：3

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