Stress-Minimized Packaging of Inertial Sensors by Double-Sided Bond Wire Attachment

被引:19
|
作者
Schroder, Stephan [1 ,2 ]
Niklaus, Frank [1 ]
Nafari, Alexandra [3 ]
Westby, Eskild R. [4 ]
Fischer, Andreas C. [1 ,5 ]
Stemme, Goran [1 ]
Haasl, Sjord [6 ,7 ]
机构
[1] KTH Royal Inst Technol, Dept Micro & Nanosyst, S-11428 Stockholm, Sweden
[2] Senseair AB, S-82060 Delsbo, Sweden
[3] Volvo Car Grp, S-40508 Gothenburg, Sweden
[4] Micronitor AS, N-7052 Trondheim, Norway
[5] Karlsruhe Inst Technol, Inst Nanotechnol, D-76344 Karlsruhe, Germany
[6] Karolinska Inst, KTH Royal Inst Technol, Ctr Technol Med & Hlth, S-17177 Stockholm, Sweden
[7] Stockholm Cty Council, S-17177 Stockholm, Sweden
基金
欧洲研究理事会;
关键词
Low-stress die attach; wire bonding; inertial sensors; microelectromechanical systems (MEMS); laser Doppler vibrometry; white-light interferometry; packaging; gyroscope; MEMS;
D O I
10.1109/JMEMS.2015.2439042
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a novel approach for low-stress packaging of microelectromechanical system (MEMS)-based gyroscopes. The proposed approach makes use of conventional ball-stitch wire bonding. The gyroscope die is attached exclusively by means of bond wire connections between the package frame, and the top and bottom surfaces of the die. The process enables the electrical connection of metal pads on the top and the bottom side of the MEMS die within the same process. No adhesives, glue, or solder is used for the die attach. The stiffness of the proposed die attach is evaluated by scanning laser Doppler vibrometry. White-light interferometry is used to investigate stress in the die that is induced by the die attach. The bond wire attachment is compared with conventional single-sided die attach using two types of commercially available adhesives. It was found that the proposed packaging system exhibits multiple resonance modes and displays a dependence on the amount of bond wires. White-light interferometry reveals a centered bow across the die and shows low-induced stresses compared with conventionally attached dies using epoxy adhesives.
引用
收藏
页码:781 / 789
页数:9
相关论文
共 50 条
  • [31] Wire cut of double-sided minimal surfaces (vol 34, pg 985, 2018)
    Hua, Hao
    Jia, Tingli
    VISUAL COMPUTER, 2020, 36 (01): : 227 - 228
  • [32] Charge collection studies of heavily irradiated 3D Double-Sided sensors
    Bates, Richard L.
    Parkes, C.
    Pennicard, D.
    Rakotomiaramanana, B.
    Fleta, C.
    Pellegrini, G.
    Lozano, M.
    Parzefall, U.
    Blot, X.
    Haerkoenen, J.
    Tuovinen, E.
    2009 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-5, 2009, : 148 - +
  • [33] Stress-Induced Deformation of Thin Copper Substrate in Double-Sided Lapping
    Jiang Guo
    Zengxu He
    Bo Pan
    Bin Wang
    Qian Bai
    Jinxing Kong
    Renke Kang
    Chinese Journal of Mechanical Engineering, 2023, (01) : 96 - 105
  • [34] Residual Stress Asymmetry in Thin Sheets of Double-Sided Shot Peened Aluminum
    Ghanbari, Siavash
    Sangid, Michael D.
    Bahr, David F.
    JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE, 2019, 28 (05) : 3094 - 3104
  • [35] Stress-Induced Deformation of Thin Copper Substrate in Double-Sided Lapping
    Jiang Guo
    Zengxu He
    Bo Pan
    Bin Wang
    Qian Bai
    Jinxing Kong
    Renke Kang
    Chinese Journal of Mechanical Engineering, 36
  • [36] A 6.5kV Wire-bondless, Double-sided Cooling Power Electronic Module
    Zhang, H.
    Ang, S. S.
    Mantooth, A.
    Balda, J. C.
    2012 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE), 2012, : 444 - 450
  • [37] Residual Stress Asymmetry in Thin Sheets of Double-Sided Shot Peened Aluminum
    Siavash Ghanbari
    Michael D. Sangid
    David F. Bahr
    Journal of Materials Engineering and Performance, 2019, 28 : 3094 - 3104
  • [38] Stress-Induced Deformation of Thin Copper Substrate in Double-Sided Lapping
    Jiang Guo
    Zengxu He
    Bo Pan
    Bin Wang
    Qian Bai
    Jinxing Kong
    Renke Kang
    Chinese Journal of Mechanical Engineering, 2023, 36 (01) : 96 - 105
  • [39] Stress-Induced Deformation of Thin Copper Substrate in Double-Sided Lapping
    Guo, Jiang
    He, Zengxu
    Pan, Bo
    Wang, Bin
    Bai, Qian
    Kong, Jinxing
    Kang, Renke
    CHINESE JOURNAL OF MECHANICAL ENGINEERING, 2023, 36 (01)
  • [40] Development of Double-Sided with Double-Chip Stacking Structure using Panel Level Embedded Wafer Level Packaging
    Su, Yen-Fu
    Lin, Chun-Te
    Kuo, Tzu-Ying
    Chiang, Kuo-Ning
    2013 IEEE 63RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2013, : 1834 - 1839