Effective mobility enhancement of amorphous In-Ga-Zn-O thin-film transistors by holographically generated periodic conductor

被引:3
|
作者
Jeong, Jaewook [1 ]
Kim, Joonwoo [2 ]
Kim, Donghyun [3 ]
Jeon, Heonsu [4 ]
Jeong, Soon Moon [2 ]
Hong, Yongtaek [3 ]
机构
[1] Chungbuk Natl Univ, Sch Informat & Commun Engn, Cheongju, South Korea
[2] Daegu Gyeongbuk Inst Sci & Technol, Div Nano & Energy Convergence Res, Daegu, South Korea
[3] Seoul Natl Univ, Dept Elect & Commun Engn, Seoul, South Korea
[4] Seoul Natl Univ, Dept Phys & Astron, Seoul, South Korea
基金
新加坡国家研究基金会;
关键词
FABRICATION;
D O I
10.1063/1.4961379
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this study, we demonstrate a mobility enhancement structure for fully transparent amorphous indium-gallium-zinc-oxide thin-film transistors (a-IGZO TFTs) by embedding a holographically generated periodic nano-conductor in the back-channel regions. The intrinsic field-effect mobility was enhanced up to 2 times compared to that of a reference sample. The enhancement originated from a decrease in the effective channel length due to the highly conductive nano-conductor region. By combining conventional and holographic lithography, the performance of the a-IGZO TFT can be effectively improved without varying the composition of the channel layer. (C) 2016 Author(s).
引用
收藏
页数:8
相关论文
共 50 条
  • [1] Present status of amorphous In-Ga-Zn-O thin-film transistors
    Kamiya, Toshio
    Nomura, Kenji
    Hosono, Hideo
    SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS, 2010, 11 (04)
  • [2] Operating Temperature Trends in Amorphous In-Ga-Zn-O Thin-Film Transistors
    Hoshino, Ken
    Wager, John F.
    IEEE ELECTRON DEVICE LETTERS, 2010, 31 (08) : 818 - 820
  • [3] The Vacancy Pool Model for Amorphous In-Ga-Zn-O Thin-Film Transistors
    Tai, Ya-Hsiang
    Liu, Han-Wen
    Chan, Po-Chun
    IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2019, 7 (01) : 33 - 37
  • [4] Amorphous In-Ga-Zn-O thin-film transistors fabricated by microcontact printing
    Du, Xiaosong
    Frederick, Ryan T.
    Li, Yajuan
    Zhou, Zheng
    Stickle, William F.
    Herman, Gregory S.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2015, 33 (05):
  • [5] Analysis of frequency dispersion in amorphous In-Ga-Zn-O thin-film transistors
    Bhoolokam, Ajay
    Nag, Manoj
    Chasin, Adrian
    Steudel, Soeren
    Genoe, Jan
    Gelinck, Gerwin
    Groeseneken, Guido
    Heremans, Paul
    JOURNAL OF INFORMATION DISPLAY, 2015, 16 (01) : 31 - 36
  • [6] Fabrication and characterization of thin-film transistors with amorphous In-Ga-Zn-O layers
    Taube, A.
    Kaczmarski, J.
    Ekielski, M.
    Pucicki, D.
    Kaminska, E.
    Piotrowska, A.
    ELECTRON TECHNOLOGY CONFERENCE 2013, 2013, 8902
  • [7] Efficient Simulation Model for Amorphous In-Ga-Zn-O Thin-Film Transistors
    Tsuji, Hiroshi
    Nakata, Mitsuru
    Sato, Hiroto
    Nakajima, Yoshiki
    Fujisaki, Yoshihide
    Takei, Tatsuya
    Fujikake, Hideo
    Yamamoto, Toshihiro
    Shimidzu, Naoki
    JOURNAL OF DISPLAY TECHNOLOGY, 2014, 10 (02): : 101 - 106
  • [8] Scaling of Coplanar Homojunction Amorphous In-Ga-Zn-O Thin-Film Transistors
    Baek, Gwanghyeon
    Abey, Katsumi
    Kumomiy, Hideya
    Kanicki, Jerzy
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2013, 52 (03)
  • [9] Operation model with carrier-density dependent mobility for amorphous In-Ga-Zn-O thin-film transistors
    Abe, Katsumi
    Takahashi, Kenji
    Sato, Ayumu
    Kumomi, Hideya
    Nomura, Kenji
    Kamiya, Toshio
    Hosono, Hideo
    THIN SOLID FILMS, 2012, 520 (10) : 3791 - 3795
  • [10] Mobility-and temperature-dependent device model for amorphous In-Ga-Zn-O thin-film transistors
    Abe, Katsumi
    Sato, Ayumu
    Takahashi, Kenji
    Kumomi, Hideya
    Kamiya, Toshio
    Hosono, Hideo
    THIN SOLID FILMS, 2014, 559 : 40 - 43