Anisotropy and Damping in Co2FeAl0.5Si0.5 via Electrical Detection of Ferromagnetic Resonance
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作者:
Bai, Lihui
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Tohoku Univ, Fac Engn, Dept Mat Sci, Sendai, Miyagi 9808579, JapanTohoku Univ, Fac Engn, Dept Mat Sci, Sendai, Miyagi 9808579, Japan
Bai, Lihui
[1
]
Tezuka, Nobuki
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Tohoku Univ, Fac Engn, Dept Mat Sci, Sendai, Miyagi 9808579, JapanTohoku Univ, Fac Engn, Dept Mat Sci, Sendai, Miyagi 9808579, Japan
Tezuka, Nobuki
[1
]
Kohda, Makoto
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Tohoku Univ, Fac Engn, Dept Mat Sci, Sendai, Miyagi 9808579, Japan
Japan Sci & Technol Agcy, PRESTO, Kawaguchi, Saitama 3310012, JapanTohoku Univ, Fac Engn, Dept Mat Sci, Sendai, Miyagi 9808579, Japan
Kohda, Makoto
[1
,2
]
Nitta, Junsaku
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Tohoku Univ, Fac Engn, Dept Mat Sci, Sendai, Miyagi 9808579, JapanTohoku Univ, Fac Engn, Dept Mat Sci, Sendai, Miyagi 9808579, Japan
Nitta, Junsaku
[1
]
机构:
[1] Tohoku Univ, Fac Engn, Dept Mat Sci, Sendai, Miyagi 9808579, Japan
[2] Japan Sci & Technol Agcy, PRESTO, Kawaguchi, Saitama 3310012, Japan
The authors have investigated spin dynamics properties and magnetic anisotropy parameters of epitaxial Co2FeAl0.5Si0.5 (CFAS) thin films using electrical detection of ferromagnetic resonance on basis of spin rectification effect. The samples of CFAS were grown on (001) MgO substrate by sputtering, and patterned into stripes with a length of 760 m and various widths between 5 and 40 mu m for the electric detection. Analysis of the angle dependent FMR allows the anisotropy field, K-1 to be determined (1.04 x 10(5) erg/cm3). By analyzing the line width vs the resonant frequency, a damping constant alpha, of 0.005 is obtained. (C) 2012 The Japan Society of Applied Physics
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Univ York, Dept Elect, Spintron & Nanodevice Lab, York YO10 5DD, N Yorkshire, England
Seagate Technol, Dept Res & Dev, Springtown BT48 0BF, Londonderry, North IrelandUniv York, Dept Elect, Spintron & Nanodevice Lab, York YO10 5DD, N Yorkshire, England
Hassan, Sameh S. A.
Xu, Yongbing
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Univ York, Dept Elect, Spintron & Nanodevice Lab, York YO10 5DD, N Yorkshire, EnglandUniv York, Dept Elect, Spintron & Nanodevice Lab, York YO10 5DD, N Yorkshire, England
Xu, Yongbing
Hirohata, Atsufumi
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Univ York, Dept Elect, Spintron & Nanodevice Lab, York YO10 5DD, N Yorkshire, EnglandUniv York, Dept Elect, Spintron & Nanodevice Lab, York YO10 5DD, N Yorkshire, England
Hirohata, Atsufumi
Sukegawa, Hiroaki
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Natl Inst Mat Sci, Tsukuba, Ibaraki 3050047, JapanUniv York, Dept Elect, Spintron & Nanodevice Lab, York YO10 5DD, N Yorkshire, England
Sukegawa, Hiroaki
Wang, Wenhong
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Natl Inst Mat Sci, Tsukuba, Ibaraki 3050047, JapanUniv York, Dept Elect, Spintron & Nanodevice Lab, York YO10 5DD, N Yorkshire, England
Wang, Wenhong
Inomata, Koichiro
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Natl Inst Mat Sci, Tsukuba, Ibaraki 3050047, JapanUniv York, Dept Elect, Spintron & Nanodevice Lab, York YO10 5DD, N Yorkshire, England
Inomata, Koichiro
van der Laan, Gerrit
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Diamond Light Source, Didcot OX11 0DE, Oxon, EnglandUniv York, Dept Elect, Spintron & Nanodevice Lab, York YO10 5DD, N Yorkshire, England
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Univ York, Dept Elect, York YO10 5DD, N Yorkshire, England
Japan Sci & Technol Agcy, PRESTO, Kawaguchi, Saitama 3320012, JapanUniv York, Dept Elect, York YO10 5DD, N Yorkshire, England
Hirohata, Atsufumi
Izumida, Keisuke
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Nagaoka Univ Technol, Dept Elect Engn, Nagaoka, Niigata 9402188, JapanUniv York, Dept Elect, York YO10 5DD, N Yorkshire, England
Izumida, Keisuke
Ishizawa, Satoshi
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Nagaoka Univ Technol, Dept Elect Engn, Nagaoka, Niigata 9402188, JapanUniv York, Dept Elect, York YO10 5DD, N Yorkshire, England
Ishizawa, Satoshi
Sagar, James
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Univ York, Dept Phys, York YO10 5DD, N Yorkshire, EnglandUniv York, Dept Elect, York YO10 5DD, N Yorkshire, England
Sagar, James
Nakayama, Tadachika
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Nagaoka Univ Technol, Dept Elect Engn, Nagaoka, Niigata 9402188, JapanUniv York, Dept Elect, York YO10 5DD, N Yorkshire, England
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Tohoku Univ, Grad Sch Engn, Dept Mat Sci, Sendai, Miyagi 9808579, JapanTohoku Univ, Grad Sch Engn, Dept Mat Sci, Sendai, Miyagi 9808579, Japan
Onodera, Takashi
Yoshida, Masahiro
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Tohoku Univ, Grad Sch Engn, Dept Mat Sci, Sendai, Miyagi 9808579, Japan
Toshiba Co Ltd, Corp Res & Dev Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, JapanTohoku Univ, Grad Sch Engn, Dept Mat Sci, Sendai, Miyagi 9808579, Japan
Yoshida, Masahiro
Tezuka, Nobuki
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Tohoku Univ, Grad Sch Engn, Dept Mat Sci, Sendai, Miyagi 9808579, JapanTohoku Univ, Grad Sch Engn, Dept Mat Sci, Sendai, Miyagi 9808579, Japan
Tezuka, Nobuki
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Matsuura, Masashi
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Sugimoto, Satoshi
Saito, Yoshiaki
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Toshiba Co Ltd, Corp Res & Dev Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, JapanTohoku Univ, Grad Sch Engn, Dept Mat Sci, Sendai, Miyagi 9808579, Japan