On the characterization and optimization of system-level vulnerability for instruction caches in embedded processors

被引:8
|
作者
Wang, Shuai [1 ]
Duan, Guangshan [1 ]
机构
[1] Nanjing Univ, Dept Comp Sci & Technol, State Key Lab Novel Software Technol, Nanjing 210008, Jiangsu, Peoples R China
关键词
Embedded processors; Instruction cache; Reliability; Soft errors; Vulnerability factor;
D O I
10.1016/j.micpro.2015.09.011
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
With continuous scaling down of the semiconductor technology, the soft errors induced by energetic particles have become an increasing challenge in designing,current and next-generation reliable microprocessors. Due to their large share of the transistor budget and die area, cache memories suffer from an increasing vulnerability against soft errors. Previous work based on the vulnerability factor (VF) analysis proposed analytical models to evaluate the reliability of on-chip data and instruction caches. However, we have no possession of a system-level study on the vulnerability of instruction caches. In this paper, we propose a new analytical model to estimate the system-level vulnerability factor for on-chip instruction caches in embedded processors. In our model, the error masking/detection effects in instructions based on the Instruction Set Architecture (ISA) are studied. Our experimental results show that the self-error-masking/detection in instructions will reduce the VF of the instruction caches compared to the previous study. We also exemplify our design methodology by proposing several optimizing schemes to improve the reliability. Benchmarking is carried out to demonstrate the effectiveness of our vulnerability model and optimization approach, which can provide an insightful guidance for the future reliable instruction cache and ISA design. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:686 / 692
页数:7
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