Inverse magnetoresistance in textured Fe3O4 film

被引：9

作者：

Liu, Er ^{[1
]}

Zhang, Wen ^{[1
]}

Zheng, Jian-Guo ^{[2
]}

Hu, Xuefeng ^{[3
]}

Ou, Huiling ^{[1
]}

Du, Ruxia ^{[1
]}

Kou, Chaoxia ^{[1
]}

Zhai, Ya ^{[1
,4
]}

Xu, Qingyu ^{[1
]}

Du, Jun ^{[4
]}

Xu, Yongbing ^{[3
]}

Zhai, Hongru ^{[1
,4
]}

机构：

[1] Southeast Univ, Dept Phys, Jiangsu Key Lab Adv Metall Mat, Nanjing 211189, Jiangsu, Peoples R China

[2] Univ Calif Irvine, Irvine Mat Res Inst, Irvine, CA 92697 USA

[3] Univ York, Dept Elect, York YO10 5DD, N Yorkshire, England

[4] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China

来源：

JOURNAL OF ALLOYS AND COMPOUNDS | 2015年 / 649卷

基金：

美国国家科学基金会; 中国博士后科学基金;

关键词：

Inverse MR; Textured Fe3O4 film; XMCD; Spintronics;

D O I：

10.1016/j.jallcom.2015.07.108

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A surprising inverse (positive) MR effect was observed in thin film of magnetite (Fe3O4) grown on Si substrate by pulsed laser deposition (PLD). Transmission electron microscopy (TEM) and X-ray diffraction (XRD) measurements show a highly (111)-textured growth and single phase nature of Fe2O3 thin film. X-Ray Magnetic Circular Dichroism (XMCD) and X-ray absorption spectroscopy (XAS) were employed to exclude the existence of g-Fe2O3. The surface morphology of the film was investigated by atomic force microscopy (AFM). Based on the aforementioned studies, we proposed a spin dependent conduction mechanism to explain the observed anomalous MR effect. (C) 2015 Elsevier B.V. All rights reserved.

引用

页码：239 / 243

页数：5

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