Diagnostic information models: A practical approach to verticality, fault accountability, and diagnostic maturation of hierarchical systems

被引：0
|
作者：
Wegener, SA [1 ]
机构：
[1] MCDONNELL DOUGLAS CORP,ADV STUDIES GRP,ST LOUIS,MO 63166
来源：
AUTOTESTCON '96 - THE SYSTEM READINESS TECHNOLOGY CONFERENCE: TEST TECHNOLOGY AND COMMERCIALIZATION, CONFERENCE RECORD | 1996年
关键词：
D O I：
10.1109/AUTEST.1996.547775
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
引用
收藏
页码：461 / 467
页数：7
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