Effects of UVC irradiation on alpha-particle track parameters in CR-39

被引：14
|
作者：
Tse, K. C. C. [1 ]
Nikezic, D. [1 ]
Yu, K. N. [1 ]
机构：
[1] City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China
来源：
RADIATION MEASUREMENTS | 2008年 / 43卷
关键词：
CR-39; ultraviolet; track etch; alpha particle;
D O I：
10.1016/j.radmeas.2008.03.029
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
The effects of UVC exposure on the track etch rate Vt and the detector sensitivity V of CR-39 SSNTDs were investigated through the diameters and depths of alpha-particle tracks. Both the bulk etch rate V-b and V-t increased but V decreased. The track diameters and depths were used to derive a V function for CR-39 detectors with and without UV irradiation. (C) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码：S98 / S101
页数：4
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