Changes in spectral response with temperature and irradiance

被引：18
|
作者：
Müllejans, H
Wagner, T
Merli, F
Jäger-Waldau, A
Dunlop, ED
机构：
[1] Commiss European Communities, Joint Res Ctr, Inst Environm & Sustainabil, Renewable Energies Unit, I-21020 Ispra, VA, Italy
[2] Munich Univ Appl Sci, Dept Elect Engn, D-80323 Munich, Germany
来源：
THIN SOLID FILMS | 2004年 / 451卷
关键词：
spectral response; photoelectric properties; characterisation; a-Si; CIS;
D O I：
10.1016/j.tsf.2003.11.006
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The energy yield of a PV device under outdoor conditions depends on the performance of the device under large variations of three main parameters., the device temperature, the total irradiance and the spectral irradiance. To properly compare indoor and outdoor performance matrices the spectral response (SR) of the PV devices has to be measured as a function of temperature and irradiance intensity. This work presents systematic measurements of the SR of two thin film PV devices (a-Si and CIS). The SR of the a-Si device changed slightly with both parameters, whereas the SR of the CIS device remained essentially unchanged. The results provide the mismatch factor (MMF) for explicit correction of each entry in the indoor performance matrix. A good approximation. however, is to use the same MMF for the entire matrix. (C) 2003 Elsevier B.V. All rights reserved.
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页码：145 / 151
页数：7
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