An approach to symbolic test generation

被引:0
|
作者
Rusu, V [1 ]
du Bousquet, L [1 ]
Jéron, T [1 ]
机构
[1] IRISA, INRIA, Rennes, France
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暂无
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Test generation is a program-synthesis problem: starting from the formal specification of a system under test, and from a test purpose describing a set of behaviours to be tested, compute a reactive program that observes an implementation of the system to detect nonconformant behaviour, while trying to control it towards satisfying the test purpose. In this paper we describe an approach for generating symbolic test cases, in the form of input-output automata with variables and parameters.
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页码:338 / 357
页数:20
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