Sequential circuit test generation using a symbolic/genetic hybrid approach

被引：3
|
作者：
Fummi, F [1 ]
Boschini, M
Yu, XM
Rudnick, EM
机构：
[1] Univ Verona, DST Informat, I-37100 Verona, Italy
[2] STMicroelect, Milan, Italy
[3] Univ Illinois, Ctr Reliable & High Performance Comp, Urbana, IL 61801 USA
来源：
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2001年 / 17卷 / 3-4期
关键词：
automatic test generation; binary decision diagrams; finite state machine with datapath; genetic algorithms;
D O I：
10.1023/A:1012275631257
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Symbolic and genetic techniques are combined in a new approach to sequential circuit test generation that uses circuit decomposition, rather than the algorithmic decomposition used in previous hybrid test generators. Symbolic techniques are used to generate test sequences for the control logic, and genetic algorithms are used to generate sequences for the datapath. The combined sequences provide higher fault coverages than those generated by existing deterministic and GA-based test generators, and execution times are significantly lower in many cases.
引用
收藏
页码：321 / 330
页数：10
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