Laser diode burn-in and reliability testing

被引:0
|
作者
Johnson, LA
机构
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
More than 99 percent of all lasers manufactured in the world today are semiconductor laser diodes. Reliability is a concern in every laser diode application, whether it is a simple $10 laser pointer or a space-qualified optical transmitter link. The commercial success of a laser supplier rests largely on his ability to develop a robust manufacturing process that consistently produces reliable devices combined with the quantitative assurances he can provide to his customers proving the reliability of his devices. Over the past two decades, laser diode reliability testing techniques and equipment have evolved to support the diverse development of laser diodes.
引用
收藏
页码:S7 / S10
页数:4
相关论文
共 50 条
  • [41] Burn-in considering yield loss and reliability gain for integrated circuits
    Kim, Kyungmee O.
    EUROPEAN JOURNAL OF OPERATIONAL RESEARCH, 2011, 212 (02) : 337 - 344
  • [42] A Study on Performance Degradation of SiC MOSFET for Burn-in Test of Body Diode
    Funaki, Tsuyoshi
    2013 4TH IEEE INTERNATIONAL SYMPOSIUM ON POWER ELECTRONICS FOR DISTRIBUTED GENERATION SYSTEMS (PEDG), 2013,
  • [43] Burnout or burn-in?
    Ladouceur, Roger
    CANADIAN FAMILY PHYSICIAN, 2012, 58 (07) : 722 - 722
  • [44] THE BURN-IN SCANDAL
    不详
    IEEE SPECTRUM, 1984, 21 (06) : 16 - 16
  • [45] Burn-in and covariates
    Ebrahimi, N
    JOURNAL OF APPLIED PROBABILITY, 2004, 41 (03) : 735 - 745
  • [46] BURN-IN FOR LIFE
    FLETCHER, P
    ENGINEERING, 1974, 214 (05): : 364 - 366
  • [47] Considering "after burn-in failure treatment" in determining optimal burn-in
    Liu, Xin
    Mazzuchi, Thomas A.
    TWELFTH ISSAT INTERNATIONAL CONFERENCE RELIABILITY AND QUALITY IN DESIGN, PROCEEDINGS, 2006, : 92 - +
  • [48] Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing
    Deligiannist, Nikolaos I.
    Faller, Tobias
    Chenghan, Zhou
    Cantoro, Riccardo
    Becker, Bernd
    Reorda, Matteo Sonza
    2023 IEEE EUROPEAN TEST SYMPOSIUM, ETS, 2023,
  • [49] Maximization of power dissipation under random excitation for burn-in testing
    Huang, KC
    Lee, CL
    Chen, JE
    INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS, 1998, : 567 - 576
  • [50] Novel Magnetic Burn-In for Retention and Magnetic Tolerance Testing of STTRAM
    Khan, Mohammad Nasim Imtiaz
    Iyengar, Anirudh S.
    Ghosh, Swaroop
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018, 26 (08) : 1508 - 1517