Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas

Rich soft X-ray emission lines of highly charged silicon ions (Si vi-Si XII) were observed by irradiating an ultraintense laser pulse with width of 200 fs and energy of similar to 90 mJ on the solid silicon target. The high-resolution spectra of highly charged silicon ions with full width at half-maximum (FWHM) of similar to 0.3Y0.4 angstrom is analyzed in the wavelength range of 40-90 angstrom. The wavelengths of 53 prominent lines are determined with statistical uncertainties of up to 0.005 angstrom. Collisional-radiative models were constructed for Si VI-Si XII ions, which satisfactorily reproduce the experimental spectra and help in the line identification. Calculations at different electron densities reveal that the spectra of dense plasmas are more complicated than the spectra of thin plasmas. A comparison with the Kelly database reveals a good agreement for most peak intensities and differences for a few emission lines.