A device for comprehensive performance test of photoelectric system

被引：0
|
作者：
Chen Xiaomei [1 ]
Liu Changjiang [2 ]
Hu Leili [1 ]
Du Baolin [1 ]
机构：
[1] AVIC, Luoyang Inst Electroopt Equipment, Luoyang 471009, Peoples R China
[2] Armored Force Inst, Bengbu 233050, Anhui, Peoples R China
来源：
9TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES (AOMATT 2018): OPTICAL TEST, MEASUREMENT TECHNOLOGY, AND EQUIPMENT | 2019年 / 10839卷
关键词：
detection sensitivity; resolution; optical axis consistency; optoelectronic system;
D O I：
10.1117/12.25055263
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The common methods for measuring the consistency of optical axis of multispectral and multi optical axis optoelectronic system are introduced in detail in this paper. The advantages and disadvantages of various methods are analyzed in detail. For the latest test requirements for the multi optical axis consistency of the current photoelectric system, a set of new test schemes for measuring the consistency of the laser emission axis and the sight axis, ant the laser receiving axis and the sight axis are designed. The device can also test the detection sensitivity and resolution of photoelectric system. The shortcoming of the old scheme, that can not be tested for laser receiving optical axis consistency , is soved. The design results show that the whole testing system meets the development trend of automation and lightweight, possessing extensive application prospect of optical axis consistency testing system.
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页数：4
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