High resolution speckle interferometry using virtual speckle pattern produced by information of deformation process

A high resolution new fringe analysis method for ESPI with only one camera is proposed by using features of speckle interferometry in a deformation process of a measured object. The profile of intensity of each speckle of the speckle patterns in the deformation process is analyzed by the Hilbert transform. A virtual speckle pattern for creating a carrier fringe image is produced artificially by using the information of profiles of intensities of speckles. The deformation map of the measured object can be detected by the virtual speckle pattern in an operation based on the spatial fringe analysis method. Experimental results show that the difference between the results by the new and the ordinary methods is 0.1 rad as standard deviation. From the results, it is confirmed that the high resolution measurement can be performed by this method the same as compared to the ordinary measurement method which needs to employ three speckle patterns.