Fabrication of a side aligned optical fibre interferometer by focused ion beam machining

被引:4
|
作者
Sun, J. [1 ]
Li, J. [2 ]
Maier, R. R. J. [2 ]
Hand, D. P. [2 ]
MacPherson, W. N. [2 ]
Miller, M. K. [1 ]
Ritchie, J. M. [1 ]
Luo, X. [1 ,3 ]
机构
[1] Heriot Watt Univ, Inst Mech Proc & Energy Engn, Edinburgh EH14 4AS, Midlothian, Scotland
[2] Heriot Watt Univ, Scottish Univ Phys Alliance, Inst Photon & Quantum Sci, Edinburgh EH14 4AS, Midlothian, Scotland
[3] Univ Strathclyde, Dept Design Mfg & Engn Management, Glasgow G4 0NG, Lanark, Scotland
基金
英国工程与自然科学研究理事会;
关键词
3-DIMENSIONAL MICROSTRUCTURES; DEPTH CONTROL; SENSOR; TEMPERATURE; ARRAYS;
D O I
10.1088/0960-1317/23/10/105005
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Focused ion beam (FIB) machining is a promising technique for the fabrication of micro-optical components with high quality surface finishes. In this work, a prototype of a side aligned optical fibre interferometer was successfully fabricated by the three-dimensional deterministic FIB machining technique. A highly accurate 45 degrees reflective mirror with surface roughness (Ra) of 10 nm has been successfully fabricated at the centre of the fibre to direct the core guided light to the side of the fibre. A surface topography simulation method was developed to simulate the ion beam polishing process. According to the simulation result, a 0.5 degrees offset on the ion beam polishing direction is necessary to maintain the machining accuracy. In the fabrication process, it was also found that for structures requiring a high aspect ratio the existence of an open edge can mitigate against the material redeposition on the sidewalls and therefore increase the overall material removal rate. The fibre has been tested optically and the interference signals have been successfully observed, demonstrating the alignment accuracy of the fabrication method.
引用
收藏
页数:9
相关论文
共 50 条
  • [41] Fabrication of Freeform Micro Optics by Focused Ion Beam
    Sun, Jining
    Luo, Xichun
    Chang, Wenlong
    Ritchie, James M.
    PROCEEDINGS OF PRECISION ENGINEERING AND NANOTECHNOLOGY (ASPEN2011), 2012, 516 : 414 - 419
  • [42] Fabrication of YBaCuO junctions by the irradiation of focused ion beam
    Shiga, H
    Soutome, Y
    Okabe, Y
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1999, 9 (02) : 2890 - 2893
  • [43] Wedge emitter fabrication using focused ion beam
    Ochiai, C
    Sawada, A
    Noriyasu, H
    Takai, M
    Hosono, A
    Okuda, S
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (03): : 904 - 906
  • [44] Fabrication of nanoscale Ti honeycombs by focused ion beam
    Hosokawa, H
    Shimojima, K
    Chino, Y
    Yamada, Y
    Wen, CE
    Mabuchi, M
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2003, 344 (1-2): : 365 - 367
  • [45] Focused ion beam fabrication of silicon print masters
    Li, HW
    Kang, DJ
    Blamire, MG
    Huck, WTS
    NANOTECHNOLOGY, 2003, 14 (02) : 220 - 223
  • [46] Fabrication of YBaCuO junctions by the irradiation of focused ion beam
    Shiga, H.
    Soutome, Y.
    Okabe, Y.
    IEEE Transactions on Applied Superconductivity, 1999, 9 (2 III): : 2890 - 2893
  • [47] FOCUSED-ION-BEAM PROCESSES FOR DEVICE FABRICATION
    KUBENA, RL
    ANDERSON, CL
    SELIGER, RL
    BRAULT, RG
    MILLER, LJ
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (10) : 1253 - 1253
  • [48] Focused ion beam nanopatterning for optoelectronic device fabrication
    Kim, YK
    Danner, AJ
    Raftery, JJ
    Choquette, KD
    IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2005, 11 (06) : 1292 - 1298
  • [49] Application of focused ion beam for the fabrication of AFM probes
    Kolomiytsev, A. S.
    Lisitsyn, S. A.
    Smirnov, V. A.
    Fedotov, A. A.
    Varzarev, Yu N.
    SCANNING PROBE MICROSCOPY 2017 (SPM-2017), 2017, 256
  • [50] Focused Ion Beam fabrication of large and complex nanopatterns
    Wilhelmi, O.
    Roussel, L.
    Anzalone, P.
    Stokes, D. J.
    Faber, P.
    Reyntjens, S.
    NANOTECH CONFERENCE & EXPO 2009, VOL 1, TECHNICAL PROCEEDINGS: NANOTECHNOLOGY 2009: FABRICATION, PARTICLES, CHARACTERIZATION, MEMS, ELECTRONICS AND PHOTONICS, 2009, : 24 - 27