Unconstrained face verification with a dual-layer block-based metric learning

被引:1
|
作者
Chong, Siew-Chin [1 ]
Teoh, Andrew Beng Jin [2 ]
Ong, Thian-Song [1 ]
机构
[1] Multimedia Univ, Fac Informat Sci & Technol, Melaka, Malaysia
[2] Yonsei Univ, Sch Elect & Elect Engn, Seoul, South Korea
关键词
Unconstrained face; Metric learning; Block-based; Verification; Restricted;
D O I
10.1007/s11042-015-3120-5
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, a dual-layer block-based metric learning technique is proposed to better discriminate the face image pairs and accelerate the overall verification process under the unconstrained environment. The input images are processed as blocks to provide a richer base of face features. Our proposed method is formed by two layers, in which the first layer assists in extracting the compact block-based descriptors without the existence of full class label information and to refine the within-class and between-class scatter matrices while the second layer integrates the face descriptors of all blocks. The proposed scheme has computational advantage over the single metric learning method while it exploits the correlations among the multiple metrics from different descriptors. The performance of our proposed method is evaluated on the Labeled Faces in the Wild database and achieves an improved performance when compared with the state-of-the-art methods in terms of verification rate and computation time.
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页码:1703 / 1719
页数:17
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