Metal-assisted etching of silicon molds for electroforming

被引:6
|
作者
Divan, Ralu [1 ]
Rosenthal, Dan [2 ]
Ogando, Karim [3 ,4 ]
Ocola, Leonidas E. [1 ]
Rosenmann, Daniel [1 ]
Moldovan, Nicolaie [5 ]
机构
[1] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA
[2] Illinois Math & Sci Acad, Aurora, IL 60506 USA
[3] Ctr Atom Bariloche, RA-8400 San Carlos De Bariloche, Rio Negro, Argentina
[4] Inst Balseiro, RA-8400 San Carlos De Bariloche, Rio Negro, Argentina
[5] Adv Diamond Technol Inc, Romeoville, IL 60446 USA
来源
关键词
NANOWIRES; ARRAYS; FABRICATION; NANOSTRUCTURES; LITHOGRAPHY; DIAMETER;
D O I
10.1116/1.4821651
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ordered arrays of high-aspect-ratio micro/nanostructures in semiconductors stirred a huge scientific interest due to their unique one-dimensional physical morphology and the associated electrical, mechanical, chemical, optoelectronic, and thermal properties. Metal-assisted chemical etching enables fabrication of such high aspect ratio Si nanostructures with controlled diameter, shape, length, and packing density, but suffers from structure deformation and shape inconsistency due to uncontrolled migration of noble metal structures during etching. Hereby the authors prove that a Ti adhesion layer helps in stabilizing gold structures, preventing their migration on the wafer surface while not impeding the etching. Based on this finding, the authors demonstrate that the method can be used to fabricate linear Fresnel zone plates. (C) 2013 American Vacuum Society.
引用
收藏
页数:6
相关论文
共 50 条
  • [41] Direct Imprinting of Porous Silicon via Metal-Assisted Chemical Etching
    Azeredo, Bruno P.
    Lin, Yu-Wei
    Avagyan, Arik
    Sivaguru, Mayandi
    Hsu, Keng
    Ferreira, Placid
    ADVANCED FUNCTIONAL MATERIALS, 2016, 26 (17) : 2929 - 2939
  • [42] Raman spectroscopy of nanostructured silicon fabricated by metal-assisted chemical etching
    Iatsunskyi, Igor
    Jurga, Stefan
    Smyntyna, Valentyn
    Pavlenko, Mykolai
    Myndrul, Valeriy
    Zaleska, Anastasia
    OPTICAL MICRO- AND NANOMETROLOGY V, 2014, 9132
  • [43] Bubble Effects on Manufacturing of Silicon Nanowires by Metal-Assisted Chemical Etching
    Lee, Pee-Yew
    Weng, Chun-Jen
    Huang, Hung Ji
    Wu, Li-Yan
    Lu, Guo-Hao
    Liu, Chao-Feng
    Chen, Cheng-You
    Li, Ting-Yu
    Lin, Yung-Sheng
    JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING-TRANSACTIONS OF THE ASME, 2023, 145 (09):
  • [44] Metal-assisted etching of p-silicon-Pore formation and characterization
    El-Sherif, Rabab M.
    Khalil, Shaaban A.
    Badawy, Waheed. A.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2011, 509 (10) : 4122 - 4126
  • [45] Catalytic activity of noble metals for metal-assisted chemical etching of silicon
    Shinji Yae
    Yuma Morii
    Naoki Fukumuro
    Hitoshi Matsuda
    Nanoscale Research Letters, 7
  • [46] Catalytic activity of noble metals for metal-assisted chemical etching of silicon
    Yae, Shinji
    Morii, Yuma
    Fukumuro, Naoki
    Matsuda, Hitoshi
    NANOSCALE RESEARCH LETTERS, 2012, 7 : 1 - 5
  • [47] Fabrication and characterization of silicon nanostructures based on metal-assisted chemical etching
    Zhang, Wendong
    Fan, Xuge
    Sang, Shengbo
    Li, Pengwei
    Li, Gang
    Sun, Yongjiao
    Hu, Jie
    KOREAN JOURNAL OF CHEMICAL ENGINEERING, 2014, 31 (01) : 62 - 67
  • [48] Hierarchical silicon nanostructured arrays via metal-assisted chemical etching
    Lin, Hao
    Fang, Ming
    Cheung, Ho-Yuen
    Xiu, Fei
    Yip, Senpo
    Wong, Chun-Yuen
    Ho, Johnny C.
    RSC ADVANCES, 2014, 4 (91): : 50081 - 50085
  • [49] Silicon Nanowire Arrays Combining Nanosphere Lithography and Metal-Assisted Etching
    Levy-Clement, C.
    Wang, X.
    Pittet, P.
    PITS AND PORES 4: NEW MATERIALS AND APPLICATIONS - IN MEMORY OF ULRICH GOSELE, 2011, 33 (16): : 15 - 22
  • [50] How the Oxidation Stability of Metal Catalysts Defines the Metal-Assisted Chemical Etching of Silicon
    Williams, Max O.
    Hiller, Daniel
    Bergfeldt, Thomas
    Zacharias, Margit
    JOURNAL OF PHYSICAL CHEMISTRY C, 2017, 121 (17): : 9296 - 9299