Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin films

被引：20

作者：

Behler, Anna ^{[1
,2
]}

Teichert, Niclas ^{[3
]}

Dutta, Biswanath ^{[4
]}

Waske, Anja ^{[1
]}

Hickel, Tilmann ^{[4
]}

Auge, Alexander ^{[3
]}

Huetten, Andreas ^{[3
]}

Eckert, Juergen ^{[1
,5
]}

机构：

[1] IFW Dresden, Inst Complex Mat, D-01171 Dresden, Germany

[2] Tech Univ Dresden, Inst Solid State Phys, Dept Phys, D-01062 Dresden, Germany

[3] Univ Bielefeld, Dept Phys Thin Films & Phys Nanostruct, D-33501 Bielefeld, Germany

[4] Max Planck Inst Eisenforsch GmbH, D-40237 Dusseldorf, Germany

[5] Tech Univ Dresden, Inst Mat Sci, D-01062 Dresden, Germany

来源：

AIP ADVANCES | 2013年 / 3卷 / 12期

关键词：

TRANSFORMATIONS;

D O I：

10.1063/1.4849795

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A thickness dependent exchange bias in the low temperature martensitic state of epitaxial Ni-Mn-Sn thin films is found. The effect can be retained down to very small thicknesses. For a Ni50Mn32Sn18 thin film, which does not undergo a martensitic transformation, no exchange bias is observed. Our results suggest that a significant interplay between ferromagnetic and antiferromagnetic regions, which is the origin for exchange bias, is only present in the martensite. The finding is supported by ab initio calculations showing that the antiferromagnetic order is stabilized in the phase. (C) 2013 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.

引用

页数：9

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