High-throughput zone-melting recrystallization for crystalline silicon thin-film solar cells

被引:21
|
作者
Reber, S [1 ]
Eyer, A [1 ]
Haas, F [1 ]
机构
[1] Fraunhofer Inst Solar Energy Syst ISE, D-79110 Freiburg, Germany
关键词
recrystallization; volume defects; elemental solids; semiconducting silicon; solar cells;
D O I
10.1016/j.jcrysgro.2005.11.051
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Crystalline silicon thin-film solar cells which shall exceed a conversion efficiency of 15% require a coarse-grained silicon layer of at least 5 put thickness as an absorber layer, with minority carrier diffusion length and grain diameter at least twice the layer thickness. At Fraunhofer ISE, we use zone-melting recrystallization to recrystallize a silicon layer grown by chemical vapor deposition on high-temperature stable substrates. Our main focus is the development of tools and processes for achieving silicon layers of sufficient electrical quality at high throughput and low cost. A processor for in-line zone melting of 400-mm-wide samples was developed, which has gas curtain load locks and thus offers a theoretical maximum throughput of approx. 10m(2)/h at a melting velocity of 500mm/min. Zone-melting experiments with varying melting velocity showed that high crystal quality can be maintained even for velocities up to 350 mm/min. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:391 / 396
页数:6
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