Optical characterization of multilayer stacks used as phase-change media of optical disk data storage

被引：8
|
作者：
Liang, RG
Peng, CB
Nagata, K
Daly-Flynn, K
Mansuripur, M
机构：
[1] Eastman Kodak Co, Engn Phys, Rochester, NY 14650 USA
[2] Univ Arizona, Ctr Opt Sci, Tucson, AZ 85721 USA
[3] Matsushita Elect Ind Co Ltd, Opt Disk Syst Dev Ctr, Osaka, Japan
[4] Energy Convers Devices Inc, Troy, MI 48084 USA
来源：
APPLIED OPTICS | 2002年 / 41卷 / 02期
关键词：
D O I：
10.1364/AO.41.000370
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We report results of measurements of the optical constants of the dielectric layer (ZnS-SiO2), reflecting layer (aluminum-chromium alloy), and phase-change layer (GeSbTe, AgInSbTe) used as the media of phase-change optical recording. The refractive index n and the absorption coefficient k of these materials vary to some extent with the film thickness and with the film deposition environment, We report the observed variations of optical constants among samples of differing structure and among samples fabricated in different laboratories. (C) 2002 Optical Society of America.
引用
收藏
页码：370 / 378
页数：9
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