Contactless Measurement of Absolute Voltage Waveforms by a Passive Electric-Field Probe

被引:13
|
作者
Hou, Rui [1 ]
Spirito, Marco [2 ]
Van Rijs, Fred [3 ]
de Vreede, Leo C. N. [2 ]
机构
[1] Ericsson, Stockholm, Sweden
[2] Delft Univ Technol, Delft, Netherlands
[3] Ampleon Netherlands, Nijmegen, Netherlands
关键词
Calibration; electric-field probe; microwave circuit testing; nonlinear vector network analyzer (NVNA);
D O I
10.1109/LMWC.2016.2623250
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work proposes an improved technique for accurate, contactless measurement of the absolute voltage waveforms of microwave circuits, employing a passive electric-field sensing probe. The proposed technique uses an electromagnetic model of the interaction between the probe and a device under test, to allow the extraction of the coupling capacitance variation versus frequency. Employing these information the measurement accuracy is improved, especially for higher (i.e., harmonic) frequencies, yielding enhanced waveform fidelity. The proposed method is validated on a microstrip line carrying waveforms with rich harmonic content. The accuracy of the proposed technique is benchmarked against a conventional thru-reflect-line (TRL) de-embedding approach by a nonlinear vector network analyzer (NVNA). Measurement results show that the root-mean square (RMS) error can be improved by 3 percentage points (from 8% to 5%) compared to the prior arts over the frequency range from 1 to 5 GHz.
引用
收藏
页码:1008 / 1010
页数:3
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