Astigmatism-corrected flat-field XUV spectrograph and its aberration analysis

被引：0
|
作者：
Choi, IW [1 ]
Shin, HJ [1 ]
Lee, JU [1 ]
Nam, CH [1 ]
机构：
[1] KOREA ADV INST SCI & TECHNOL,DEPT PHYS,TAEJON 305701,SOUTH KOREA
来源：
17TH CONGRESS OF THE INTERNATIONAL COMMISSION FOR OPTICS: OPTICS FOR SCIENCE AND NEW TECHNOLOGY, PTS 1 AND 2 | 1996年 / 2778卷
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
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页码：1228 / 1229
页数：2
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