共 50 条
- [41] High resolution X-ray Reciprocal Space Mapping of wavy layers POLYCRYSTALLINE THIN FILMS - STRUCTURE, TEXTURE, PROPERTIES AND APPLICATIONS III, 1997, 472 : 257 - 268
- [43] Embedded GaAs nanopillars studied by high resolution reciprocal space mapping and SEM PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2014, 211 (06): : 1319 - 1324
- [46] In-situ study of microstructural evolution and local strain distribution during tensile loading of near-micrometre grain size aluminium 40TH RISO INTERNATIONAL SYMPOSIUM ON MATERIALS SCIENCE: METAL MICROSTRUCTURES IN 2D, 3D AND 4D, 2019, 580
- [48] IN-SITU MEASUREMENT OF OBJECTIVE LENS DATA OF A HIGH-RESOLUTION ELECTRON MICROSCOPE OPTIK, 1971, 34 (02): : 113 - +