Voltage-Triggered Ultrafast Phase Transition in Vanadium Dioxide Switches

被引:236
|
作者
Zhou, You [1 ]
Chen, Xiaonan [2 ]
Ko, Changhyun
Yang, Zheng
Mouli, Chandra [2 ]
Ramanathan, Shriram [1 ]
机构
[1] Harvard Univ, Sch Engn & Appl Sci, Cambridge, MA 02138 USA
[2] Micron Technol Inc, Boise, ID 83707 USA
关键词
Correlated electrons; memory; metal-insulator transition (MIT); ultrafast switch; vanadium dioxide;
D O I
10.1109/LED.2012.2229457
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Electrically driven metal-insulator transition (MIT) in vanadium dioxide (VO2) is of interest in emerging memory devices, neural computation, and high-speed electronics. We report on the fabrication of out-of-plane VO2 metal-insulator-metal structures and reproducible high-speed switching measurements in these two-terminal devices. We have observed a clear correlation between the electrically driven ON/OFF current ratio and the thermally induced resistance change during MIT. It is also found that sharp MIT could be triggered by the external voltage pulses within 2 ns at room temperature and the achieved ON/OFF ratio is greater than two orders of magnitude with good endurance.
引用
收藏
页码:220 / 222
页数:3
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