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Time evolution of hollow cathode ionization processes in the final breakdown phase of a transient hollow cathode discharge
被引:20
|作者:
Zambra, M
[1
]
Favre, M
Moreno, J
Chuaqui, H
Wyndham, E
Choi, P
机构:
[1] Comis Chilena Energia Nucl, Santiago, Chile
[2] Pontificia Univ Catolica Chile, Santiago 22, Chile
[3] Ecole Polytech, LPMI, F-91128 Palaiseau, France
关键词:
gas discharges;
hollow cathode;
ionization growth;
D O I:
10.1109/27.774678
中图分类号:
O35 [流体力学];
O53 [等离子体物理学];
学科分类号:
070204 ;
080103 ;
080704 ;
摘要:
The enhanced ionization processes taking place inside the hollow cathode region (HCR) of a transient hollow cathode discharge (THCD) are essential events which lead to final electrical breakdown. This ionization growth is permanently assisted by a virtual anode moving in the anode-cathode gap (A-K gap), which extends the anode potential to within the hollow cathode region. In this paper, the ionization growth inside the HCR under enhanced field due to the close proximity of the anode potential has been studied using a statistical technique in a range of pressures, with three different cathode apertures. Statistical time distributions of an extensive experimental data set are analyzed to understand the mechanisms involved in the final stages, just before electric breakdown.
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页码:746 / 751
页数:6
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